BEDE PLC
- BELMONT BUSINESS PARK
DH1 1TW DURHAM
Phone: 0191 332 4700
Fax: 0191 332 4800
E-mail: Send messagewww.bede.com
Short profile:
Jordan Valley Semiconductors JVS develops, serves, manufactures and sells X ray and VUV metrology solutions XRF, XRR, XRD, WAXRD, HRXRD, SAXS & VUV to semiconductors manufacturers, such as logic IDM and foundries and memory DRAM, Flash fabs as well as hard disk drives, HBLED fabs and other compound semiconductors and related fields Our metrology tools cover front end of the line FEOL SiGe, HiK, Metal gate, back end of the line BEOL Copper Seed Barrier, Tungsten and Aluminum wafer level packa
Keywords:
compound semiconductors, NON DESTRUCTIVE RAY METROLOGY, bede d1, NANOLAMINATES, nickel, Scientific Instrument Manufacturers, ETCH STOP, jvx6200, LOW K, Medicalinstruments, bedescan, EDGE INSPECTION, Process Control, PATTERN RECOGNITION SOFTWARE, XCD, POROSITY, Strain Metrology, Small spot XRF, Scientific equipment, saxs, CRYSTAL TEXTURE, DRAM, GRAIN SIZE, ray Microanalysis, HIGH RESOLUTION X RAY DIFFRACTION, Interconnect Metals, 45NM, x-ray, METROLOGY, RELAXATION, QC3, Silver, JVX6200i, METAL GATE, CRYSTAL PHASE, x-ray microanalysis, Scientific Instruments, xrd, COPPER, HBT, ADVANCED LOGIC, thickness, Si C, INSPECTION, MIM CAPACITORS, waxrd, BICMOS, MOSFETS, qc1a, HIGH K, SEMICONDUCTOR MATERIAL COMPOSITION, BARRIER LAYER, EPITAXIAL SIGE, QC200, 90NM, COPS, soi, BACKSIDE DEFECTS INSPECTION, BEVEL DEFECTS INSPECTION, crystallography, x-ray diffraction, gan, HOLE MOBILITY, BEDE, silicon, RECESS DEPTH, COMPOSITION, etch, Epitaxial, DUAL DAMASCENE, LED manufacturing, BedeMetrix